Controlling dielectrics with the electric field of light

Nature

Volumn 493, Issue 7430, 2013, Pages 75-78

  Schultze, Martin ^a,b   Bothschafter, Elisabeth M ^a,c   Sommer, Annkatrin ^a   Holzner, Simon ^a   Schweinberger, Wolfgang ^a   Fiess, Markus ^a   Hofstetter, Michael ^b   Kienberger, Reinhard ^a,c   Apalkov, Vadym ^d   Yakovlev, Vladislav S ^b   Stockman, Mark I ^d   Krausz, Ferenc ^a,b  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^d GEORGIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

ELECTRIC FIELD; LIGHT EFFECT; MICROWAVE RADIATION; NUMERICAL MODEL; QUANTUM MECHANICS; SEMICONDUCTOR INDUSTRY; SIGNAL PROCESSING; SILICA;

ARTICLE; ELECTRIC FIELD; ELECTRICAL PARAMETERS; FEMTOSECOND LASER; LIGHT; NEAR INFRARED REFLECTANCE SPECTROSCOPY; PRIORITY JOURNAL; QUANTUM MECHANICS; SPECTROSCOPY; ULTRAVIOLET RADIATION;

EID: 84871725860     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature11720     Document Type: Article

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