Spectroscopic ellipsometry and magneto-transport investigations of Mn-doped ZnO nanocrystalline films deposited by a non-vacuum sol-gel spin-coating method

Materials Science and Engineering: B

Volumn 178, Issue 3, 2013, Pages 183-189

  Shaaban, E R ^a,b   El Hagary, M ^a,c   Emam Ismail, M ^a,d   Matar, A ^c,e   Yahia, I S ^d  

^a QASSIM UNIVERSITY   (Saudi Arabia)

^b Al Azhar University   (Egypt)

^c Helwan University   (Egypt)

^d Ain Shams University   (Egypt)

^e UNIVERSITY OF TABUK   (Saudi Arabia)

Author keywords

Dilute magnetic semiconductors; Magnetoresistance; Optical constant; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; CRYSTALLITE SIZE; DILUTED MAGNETIC SEMICONDUCTORS; ENERGY GAP; GLASS SUBSTRATES; II-VI SEMICONDUCTORS; MAGNETIC SUSCEPTIBILITY; MAGNETORESISTANCE; MANGANESE; METALLIC FILMS; NANOCRYSTALS; OPTICAL CONSTANTS; OPTICAL FILMS; REFRACTIVE INDEX; SATURATION MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; SPIN COATING; SPIN GLASS; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

DILUTE MAGNETIC SEMICONDUCTORS; IONIC RADIUS; MN CONCENTRATIONS; MN CONTENT; MN-DOPED ZNO; NANOCRYSTALLINES; NON-VACUUM; POSITIVE MAGNETORESISTANCE; SOL-GEL SPIN COATING METHOD; ZNO FILMS;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 84871721581     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2012.11.005     Document Type: Article

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