Positron annihilation spectroscopic evidence to demonstrate the flux-enhancement mechanism in morphology-controlled thin-film-composite (TFC) membrane

Environmental Science and Technology

Volumn 39, Issue 6, 2005, Pages 1764-1770

  Kim, Sung Ho ^a   Kwak, Seung Yeop ^a   Suzuki, Takenori ^b  

^a Seoul National University   (South Korea)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; POLYMERIZATION; POSITRON ANNIHILATION SPECTROSCOPY; SOLUBILITY; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMIDE LINKAGES; FLUX ENHANCEMENT MECHANISM; THIN-FILM-COMPOSITE (TFC); WATER FLUX;

COMPOSITE MATERIALS;

AMIDE; DIMETHYL SULFOXIDE; POLYAMIDE;

MEMBRANE STRUCTURE; MEMBRANE TECHNOLOGY; POLYMERIZATION; PORE SIZE; REVERSE OSMOSIS; SPECTROSCOPY; SURFACE ROUGHNESS;

AQUEOUS SOLUTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; COMPOSITE MATERIAL; CROSS LINKING; FILM; MISCIBILITY; PARTICLE SIZE; PHASE TRANSITION; POLYMERIZATION; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; REVERSE OSMOSIS; SOLUBILITY; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THIN FILM COMPOSITE MEMBRANE; WATER FLOW; X RAY PHOTOELECTRON SPECTROSCOPY;

DIMETHYL SULFOXIDE; INDUSTRIAL WASTE; MEMBRANES, ARTIFICIAL; OSMOSIS; POLYMERS; POROSITY; SPECTRUM ANALYSIS; WASTE DISPOSAL, FLUID;

EID: 15244363530     PISSN: 0013936X     EISSN: None     Source Type: Journal    
DOI: 10.1021/es049453k     Document Type: Article

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