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Volumn 101, Issue 23, 2012, Pages

Aluminum oxide-n-Si field effect inversion layer solar cells with organic top contact

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN VOLTAGE; CONTACT STRUCTURE; DEVICE PERFORMANCE; ELECTROSTATIC REPULSION; FERMI LEVEL PINNING; FIELD EFFECTS; HIGH WORK FUNCTION; MOLECULAR MONOLAYER; NEGATIVE CHARGE; PHOTOVOLTAIC DEVICES; STRONG INVERSION; TOP CONTACT;

EID: 84870944931     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4769041     Document Type: Article
Times cited : (30)

References (21)
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    • 10.1016/j.energy.2007.11.012
    • A. Stoppalo, Energy 33, 224 (2008). 10.1016/j.energy.2007.11.012
    • (2008) Energy , vol.33 , pp. 224
    • Stoppalo, A.1
  • 2
    • 36149025707 scopus 로고
    • 10.1103/PhysRev.71.717
    • J. Bardeen, Phys. Rev. 71, 717 (1947). 10.1103/PhysRev.71.717
    • (1947) Phys. Rev. , vol.71 , pp. 717
    • Bardeen, J.1
  • 11
    • 69949122699 scopus 로고    scopus 로고
    • Polycrystalline silicon films for electronic devices
    • edited by P. Siffert and E. Krimmel (Springer-Verlag, Berlin)
    • A. Slaoui and P. Siffert, Polycrystalline silicon films for electronic devices. in Silicon: Evolution and Future of a Technology, edited by, P. Siffert, and, E. Krimmel, (Springer-Verlag, Berlin, 2004).
    • (2004) Silicon: Evolution and Future of A Technology
    • Slaoui, A.1    Siffert, P.2
  • 16
    • 0001414860 scopus 로고
    • 10.1016/0039-6028(71)90092-6
    • R. Castagne and A. Vapaille, Surf. Sci. 28, 157 (1971). 10.1016/0039-6028(71)90092-6
    • (1971) Surf. Sci. , vol.28 , pp. 157
    • Castagne, R.1    Vapaille, A.2
  • 18
    • 84870931906 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-101-063249 for detailed description of frequency-dependent C(V) results and description of external quantum efficiency measurements
    • See supplementary material at http://dx.doi.org/10.1063/1.4769041 E-APPLAB-101-063249 for detailed description of frequency-dependent C(V) results and description of external quantum efficiency measurements.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.