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Surface Science

Volumn 409, Issue 3, 1998, Pages 485-500

Quantitative assessment of the photosaturation technique

(4) Aphek, O B a Kronik, L a Leibovitch, M a Shapira, Yoram a

a TEL AVIV UNIVERSITY (Israel)

Author keywords

Photosaturation; Surface band bending; Surface photovoltage

Indexed keywords

BAND STRUCTURE; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PHOTOELECTRICITY;

PHOTOSATURATION; SURFACE BAND BENDING; SURFACE PHOTOVOLTAGE;

SEMICONDUCTOR MATERIALS;

EID: 0032117002 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00277-5 Document Type: Article

Times cited : (42)

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