Reliability of 4H-SiC SBD/JBS diodes under repetitive surge current stress

2012 IEEE Energy Conversion Congress and Exposition, ECCE 2012

Volumn , Issue , 2012, Pages 2245-2248

  Huang, Xing ^a   Wang, Gangyao ^a   Lee, Meng Chia ^a   Huang, Alex Q ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM METALLIZATION; CONSTANT POWER; CURRENT LEVELS; FAILURE MECHANISM; HOLE INJECTION; JUNCTION BARRIER SCHOTTKY DIODES; MOTOR DRIVE; POWER DIODE; SAFE OPERATION AREA; SIC DIODES; SINUSOIDAL PULSE; STRESS TEST; SURGE CURRENT;

DIODES; ELECTRIC DRIVES; ENERGY CONVERSION; EXHIBITIONS; RELIABILITY; SILICON CARBIDE;

SCHOTTKY BARRIER DIODES;

EID: 84870943485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2012.6342436     Document Type: Conference Paper

References (13)

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