메뉴 건너뛰기




Volumn 1, Issue 2, 2010, Pages 68-81

Reducing pull-in voltage by adjusting gap shape in electrostatically actuated cantilever and fixed-fixed beams

Author keywords

Actuator; Electrostatic; Finite element; Gap shape; High aspect ratio; Liga; Mems; Pull in voltage

Indexed keywords

FINITE ELEMENT; GAP SHAPE; HIGH ASPECT RATIO; LIGA; PULL-IN VOLTAGE;

EID: 84870859598     PISSN: None     EISSN: 2072666X     Source Type: Journal    
DOI: 10.3390/mi1020068     Document Type: Article
Times cited : (23)

References (15)
  • 4
    • 0033316194 scopus 로고    scopus 로고
    • Extending the travel range of analog-tuned electrostatic actuators
    • Hung, E.S.; Senturia, S.D. Extending the travel range of analog-tuned electrostatic actuators. J. Microelectromech. Syst. 1999, 8, 497-505
    • (1999) J. Microelectromech. Syst. , vol.8 , pp. 497-505
    • Hung, E.S.1    Senturia, S.D.2
  • 8
    • 17044385793 scopus 로고    scopus 로고
    • Optimal design of an electrostatically actuated microbeam for maximum pull-in voltage
    • Abdalla, M.M.; Reddy, C.K.; Faris, W.F.; Gurdal, Z. Optimal design of an electrostatically actuated microbeam for maximum pull-in voltage. Comput. Struct. 2005, 83, 1320-1329
    • (2005) Comput. Struct. , vol.83 , pp. 1320-1329
    • Abdalla, M.M.1    Reddy, C.K.2    Faris, W.F.3    Gurdal, Z.4
  • 9
    • 0022717983 scopus 로고
    • Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA process)
    • Becker, E.W.; Ehrfeld, W.; Hagmann, P.; Maner, A.; Münchmeyer, D. Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA process). Microelectron. Eng. 1986, 4, 35-56
    • (1986) Microelectron. Eng. , vol.4 , pp. 35-56
    • Becker, E.W.1    Ehrfeld, W.2    Hagmann, P.3    Maner, A.4    Münchmeyer, D.5
  • 12
    • 0031168990 scopus 로고    scopus 로고
    • M-Test: A test chip for MEMS material property measurement using electrostatically actuated test structures
    • Osterberg, P.M.; Senturia, S.D. M-TEST: A test chip for MEMS material property measurement using electrostatically actuated test structures. J. Microelectromech. Syst. 1997, 6, 107-118
    • (1997) J. Microelectromech. Syst. , vol.6 , pp. 107-118
    • Osterberg, P.M.1    Senturia, S.D.2
  • 13
    • 17444404224 scopus 로고    scopus 로고
    • A closed-form model for the pull-in voltage of electrostatically actuated cantilever beams
    • Chowdhury, S.; Ahmadi, M.; Miller, W.C. A closed-form model for the pull-in voltage of electrostatically actuated cantilever beams. J. Micromech. Microeng. 2005, 15, 756-763
    • (2005) J. Micromech. Microeng. , vol.15 , pp. 756-763
    • Chowdhury, S.1    Ahmadi, M.2    Miller, W.C.3
  • 14
    • 33745169699 scopus 로고    scopus 로고
    • Pull-in voltage study of electrostatically actuated fixed-fixed beams using a VLSI on-chip interconnect capacitance model
    • Chowdhury, S.; Ahmadi, M.; Miller, W.C. Pull-in voltage study of electrostatically actuated fixed-fixed beams using a VLSI on-chip interconnect capacitance model. J. Microelectromech. Syst. 2006, 15, 639-651
    • (2006) J. Microelectromech. Syst. , vol.15 , pp. 639-651
    • Chowdhury, S.1    Ahmadi, M.2    Miller, W.C.3
  • 15
    • 36949015590 scopus 로고    scopus 로고
    • Application of the generalized differential quadrature method to the study of pull-in phenomena of MEMS switches
    • Sadeghian, H.; Rezazadeh, G.; Osterberg, P.M. Application of the generalized differential quadrature method to the study of pull-in phenomena of MEMS switches. J. Microelectromech. Syst. 2007, 16, 1334-1340.
    • (2007) J. Microelectromech. Syst. , vol.16 , pp. 1334-1340
    • Sadeghian, H.1    Rezazadeh, G.2    Osterberg, P.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.