Multi-element analysis by ArF laser excited atomic fluorescence of laser ablated plumes: Mechanism and applications

Frontiers of Physics

Volumn 7, Issue 6, 2012, Pages 670-678

  Cai, Yue ^a   Chu, Po Chun ^a   Ho, Sut Kam ^b   Cheung, Nai Ho ^a  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

^b UNIVERSITY OF MACAU   (Macao)

Author keywords

argon fluoride laser; laser plume spectroscopy; laser excited atomic fluorescence (LEAF); multi element analysis

Indexed keywords

EID: 84870787261     PISSN: 20950462     EISSN: 20950470     Source Type: Journal    
DOI: 10.1007/s11467-012-0264-x     Document Type: Review

References (24)

1. R. Noll, Laser-Induced Breakdown Spectroscopy: Fundamentals and Applications, Berlin Heidelberg: Springer, 2012.
2. N. H. Cheung, Resonance-Enhanced LIBS, in: Laser Induced Breakdown Spectroscopy: Fundamentals and Applications, edited by A. Miziolek, V. Palleschi, and I. Schechter, London: Cambridge University Press, 2006.
3. D. J. Butcher, Appl. Spectrosc. Rev., 2005, 40(2): 147.
4. S. K. Ho and N. H. Cheung, Anal. Chem., 2005, 77(1): 193.
5. S. K. Ho and N. H. Cheung, Appl. Phys. Lett., 2005, 87(26): 264104.
6. S. K. Ho and N. H. Cheung, J. Anal. At. Spectrom., 2007, 22(3): 292.
7. S. K. Lau and N. H. Cheung, Appl. Spectrosc., 2009, 63(7): 835.
8. P. C. Chu, W. L. Yip, Y. Cai, and N. H. Cheung, J. Anal. At. Spectrom., 2011, 26(6): 1210.
9. N. H. Cheung, Appl. Spectrosc. Rev., 2007, 42(3): 235.
10. Y. Cai and N. H. Cheung, Microchem. J., 2011, 97(2): 109.
11. S. K. Ho, Highly Sensitive Elemental Analysis of ArF Laser Excited Atomic Fluorescence of Laser Plumes, Thesis for the Degree of Doctor of Philosophy, Hong Kong Baptist University, 2007.
12. A. Beiser, Concepts of Modern Physics, 6th Ed., New York: McGraw Hill, 2003.
13. H. Bach and D. Krause (Eds.), Analysis of the Composition and Structure of Glass and Glass Ceramics, Berlin: Springer, 1999.
14. C. Pan, Yixing Pottery: The World of Chinese Tea Culture, especially Ch. 9, San Francisco: Long River Press, 2004.
15. J. C. J. Bart, Plastics Additives: Advanced Industrial Analysis, especially Ch. 3, Amsterdam: IOS Press, 2006.
16. Consumer Product Safety Improvement Act 2008, US Product Safety Commission, test method CPSC-CH-E1003-09.
17. M. N. Gernandt and J. J. Urlaub, J. Forensic Sci., 1996, 41: 530.
18. F. C. Kreb and K. Norrman, Prog. Photovoltaics: Res. Appl., 2007, 15: 697.
19. S. T. Lee, Z. Q. Cao, and L. S. Hung, Appl. Phys. Lett., 1999, 75(10): 1404.
20. S. J. Jo, C. S. Kim, J. B. Kim, S. Y. Ryu, J. H. Noh, H. K. Baik, Y. S. Kim, and S. J. Lee, J. Appl. Phys., 2008, 103(11): 114502.
21. L. Kirste, K. Kohler, M. Maier, M. Kinzer, M. Maier, and J. Wagner, J. Mater. Sci.: Mater. Electron., 2008, 19(S1): S176.
22. N. Bityurin and A. Malyshev, J. Appl. Phys., 2002, 92(1): 605.
23. For a comparison of the analytical performance of PLEAF against ICP-MS, see: S. K. Lau, Minimally Destructive and Multi-element Analysis of Stainless Steel by ArF Laser-Induced Plume Emissions, Thesis for the Degree of Master of Philosophy, Section 2. 4, Hong Kong Baptist University, 2012.
24. J. Pisonero, J. Koch, M. Wälle, W. Hartung, N. D. Spencer, and D. Günther, Anal. Chem., 2007, 79(6): 2325.