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Volumn 19, Issue SUPPL. 1, 2008, Pages

SIMS depth profiling of Mg back-diffusion in (AlGaIn)N light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE REGION; CLOSE PROXIMITY; DEPTH-PROFILES; III NITRIDES; LOW PRESSURE; METAL-ORGANIC; MG DOPING; SAPPHIRE SUBSTRATES; SECONDARY IONS;

EID: 53649088194     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9515-y     Document Type: Article
Times cited : (11)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.