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Volumn 19, Issue SUPPL. 1, 2008, Pages
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SIMS depth profiling of Mg back-diffusion in (AlGaIn)N light-emitting diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVE REGION;
CLOSE PROXIMITY;
DEPTH-PROFILES;
III NITRIDES;
LOW PRESSURE;
METAL-ORGANIC;
MG DOPING;
SAPPHIRE SUBSTRATES;
SECONDARY IONS;
ACTIVATION ENERGY;
CORUNDUM;
CRYSTAL GROWTH;
DEPTH PROFILING;
DIFFUSION;
ELECTROMAGNETIC WAVES;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
LIGHT EMISSION;
LIGHT EMITTING DIODES;
MAGNESIUM PRINTING PLATES;
MASS SPECTROMETRY;
NITRIDES;
ORGANIC LIGHT EMITTING DIODES (OLED);
SECONDARY ION MASS SPECTROMETRY;
SEMICONDUCTOR DOPING;
METALLORGANIC VAPOR PHASE EPITAXY;
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EID: 53649088194
PISSN: 09574522
EISSN: 1573482X
Source Type: Journal
DOI: 10.1007/s10854-007-9515-y Document Type: Article |
Times cited : (11)
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References (9)
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