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Volumn 87, Issue 26, 2005, Pages 1-3

Sensitive elemental analysis by ArF laser-induced fluorescence of laser ablation plumes: Elucidation of the fluorescence mechanism

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENTARY PARTICLES; ENERGY ABSORPTION; FLUORESCENCE; IONIZATION; LASER ABLATION; LASER BEAM EFFECTS; PHOTONS; PLASMA APPLICATIONS;

EID: 29744469429     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2149983     Document Type: Article
Times cited : (24)

References (11)
  • 3
    • 2342561927 scopus 로고    scopus 로고
    • 0267-9477
    • For recent overviews of LIPS, see J. Anal. At. Spectrom. 0267-9477 19, 419 (2004); Appl. Opt. 42, 5937 (2003).
    • (2004) J. Anal. At. Spectrom. , vol.19 , pp. 419
  • 4
    • 0242271428 scopus 로고    scopus 로고
    • For recent overviews of LIPS, see J. Anal. At. Spectrom. 0267-9477 19, 419 (2004); Appl. Opt. 42, 5937 (2003).
    • (2003) Appl. Opt. , vol.42 , pp. 5937
  • 9
    • 0347296294 scopus 로고    scopus 로고
    • Comparable delay was observed when the ArF laser was blocked and the weaker YAG LIPS signal was measured. See also S. L. Lui and N. H. Cheung, Appl. Phys. Lett. 81, 5114 (2002).
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 5114
    • Lui, S.L.1    Cheung, N.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.