Colloidal wettability probed with X-ray microscopy

Current Opinion in Colloid and Interface Science

Volumn 17, Issue 6, 2012, Pages 388-395

  Weon, Byung Mook ^a   Lee, Ji San ^a   Kim, Ji Tae ^a   Pyo, Jaeyeon ^a   Je, Jung Ho ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Colloidal wettability; Colloids; Confocal microscopy; In situ visualization; Interfacial tension; X ray microscopy

Indexed keywords

COLLOIDAL PARTICLE; COLLOIDAL SELF-ASSEMBLY; CONSISTENT ESTIMATION; CRITICAL FACTORS; FLUID INTERFACE; FLUORESCENT STAINING; IN-SITU CHARACTERIZATION; INTERFACE SCIENCE; MICROSCOPIC METHODS; NANO SCALE; OIL WATER INTERFACES; QUANTITATIVE STUDY; X RAY MICROSCOPY; XRAY IMAGING;

CONFOCAL MICROSCOPY; SURFACE TENSION; VISUALIZATION; WETTING; X RAY MICROSCOPES;

COLLOIDS;

POLY(METHYL METHACRYLATE);

ADSORPTION; ATOMIC FORCE MICROSCOPY; COLLOID; CONFOCAL MICROSCOPY; CRYSTALLIZATION; FEASIBILITY STUDY; FLUORESCENCE; INTERFACE PRESSURE; MICROSCOPY; NANOTECHNOLOGY; REVIEW; ROENTGEN MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE TENSION; WETTABILITY;

EID: 84870701222     PISSN: 13590294     EISSN: 18790399     Source Type: Journal    
DOI: 10.1016/j.cocis.2012.08.002     Document Type: Review

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