Random process of filamentary growth and localized switching mechanism in resistive switching of SiOx thin films

ECS Journal of Solid State Science and Technology

Volumn 1, Issue 3, 2012, Pages

  Chen, Yen Ting ^a   Fowler, Burt ^b   Wang, Yanzhen ^a   Xue, Fei ^a   Zhou, Fei ^a   Chang, Yao Feng ^a   Lee, Jack C ^a  

^a The University of Texas at Austin   (United States)

^b PrivaTran LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84870450543     PISSN: 21628769     EISSN: 21628777     Source Type: Journal    
DOI: 10.1149/2.013203jss     Document Type: Article

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