Scanning angle plasmon waveguide resonance Raman spectroscopy for the analysis of thin polystyrene films

Journal of Physical Chemistry C

Volumn 116, Issue 47, 2012, Pages 24987-24992

  Meyer, Matthew W ^a,b   McKee, Kristopher J ^a,b   Nguyen, Vy H T ^a,b   Smith, Emily A ^a,b  

^a U S DEPARTMENT OF ENERGY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE DIFFERENCE; CHEMICAL CONTENT; COLLECTION GEOMETRY; ELECTRONIC DEVICE; GOLD FILM; INCIDENT ANGLES; MEAN-SQUARE; PLASMON WAVEGUIDE; PLASMON WAVEGUIDE RESONANCES; POLYMER STRUCTURE; POLYMER THICKNESS; RAMAN PEAK; RAMAN SCATTER; RAMAN SIGNAL; RAMAN TECHNIQUES; REFLECTED LIGHT INTENSITY; S-POLARIZED; SCANNING ANGLES; SURFACE PLASMONS; THIN POLYMER FILMS; THIN POLYSTYRENE FILMS;

ELECTRIC FIELDS; GOLD; PLASMONS; POLYMER FILMS; POLYMERS; POLYSTYRENES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THICKNESS MEASUREMENT; WAVEGUIDES;

INTERFACES (MATERIALS);

EID: 84870428732     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp308882w     Document Type: Article

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