Near IR scanning angle total internal reflection Raman spectroscopy at smooth gold films

Analytical Chemistry

Volumn 84, Issue 10, 2012, Pages 4300-4306

  McKee, Kristopher J ^a   Meyer, Matthew W ^a   Smith, Emily A ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

4-MERCAPTOPYRIDINE; ANALYTES; BENZENETHIOLS; GOLD FILM; GOLD INTERFACE; INCIDENT ANGLES; INCIDENT FIELDS; MEAN SQUARE; METAL FILM; NEAR-IR; NONRESONANT; PEAK AREA; RAMAN MEASUREMENTS; RAMAN SCATTER; RAMAN SIGNAL; REFLECTIVITY SPECTRA; RELATIVE UNCERTAINTY; RESONANT ENHANCEMENTS; SURFACE PLASMONS; TOTAL INTERNAL REFLECTIONS; VIBRATIONAL MODES;

ELECTRIC FIELDS; METALLIC FILMS; MONOLAYERS; NITROBENZENE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SAPPHIRE;

INTERFACES (MATERIALS);

EID: 84861120398     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac203355a     Document Type: Article

References (36)

1. Ikeshoji, T.; Ono, Y.; Mizuno, T. Appl. Opt. 1973, 12, 2236
2. Iwamoto, R.; Miya, M.; Ohta, K.; Mima, S. J. Am. Chem. Soc. 1980, 102, 1212
3. Iwamoto, R.; Miya, M.; Ohta, K.; Mima, S. J. Chem. Phys. 1981, 74, 4780
4. Iwamoto, R.; Ohta, K.; Miya, M.; Mima, S. Appl. Spectrosc. 1981, 35, 584
5. Nakanaga, T.; Takenaka, T. J. Phys. Chem. 1977, 81, 645
6. Takenaka, T.; Nakanaga, T. J. Phys. Chem. 1976, 80, 475
7. Fontaine, N. H.; Furtak, T. E. J. Opt. Soc. Am. B: Opt. Phys. 1997, 14, 3342
8. Fontaine, N. H.; Furtak, T. E. Phys. Rev. B: Condens. Matter Mater. Phys. 1998, 57, 3807
9. Fujiwara, K.; Watarai, H. Langmuir 2003, 19, 2658
10. Greene, P. A.; Bain, C. D. Spectrosc. Eur. 2004, 16, 8
11. Greene, P. R.; Bain, C. D. Colloids Surf., B: Biointerf. 2005, 45, 174
12. Hoelzer, W.; Schroeter, O.; Richter, A. J. Mol. Struct. 1990, 217, 253
13. D'Hooge, L.; Vigoureux, J. M.; Menu, C. J. Chem. Phys. 1981, 74, 3639
14. Woods, D. A.; Bain, C. D. Analyst (Cambridge, United Kingdom) 2012, 137, 35
15. Woods, D. A.; Petkov, J.; Bain, C. D. Colloids and Surf., A: Physicochem. Eng. Aspects 2011, 391, 10
16. McKee, K. J.; Smith, E. A. Rev. Sci. Instrum. 2010, 81, 043106
17. Camden, J. P.; Dieringer, J. A.; Zhao, J.; Van Duyne, R. P. Acc. Chem. Res. 2008, 41, 1653
18. Stiles, P. L.; Dieringer, J. A.; Shah, N. C.; Van Duyne, R. P. Annu. Rev. Anal. Chem. 2008, 1, 601
19. Asher, S. A. Anal. Chem. 1993, 65, 201A
20. Asher, S. A. Anal. Chem. 1993, 65, 59A
21. Kim, H.; Kosuda, K. M.; Van Duyne, R. P.; Stair, P. C. Chem. Soc. Rev. 2010, 39, 4820
22. Larmour, I. A.; Graham, D. Analyst (Cambridge, U.K.) 2011, 136, 3831
23. Guicheteau, J.; Christesen, S.; Emge, D.; Wilcox, P.; Fountain, A. W., III Appl. Spectrosc. 2011, 65, 144
24. Brioude, A.; Lequevre, F.; Mugnier, J.; Dumas, J.; Guiraud, G.; Plenet, J. C. J. Appl. Phys. 2000, 88, 6187
25. Corn, R. M.; Philpott, M. R. Surface Plasmon-Enhanced Raman Scattering at Thin Silver Films; IBM Res. Lab.: San Jose, CA, U.S.A., 1983.
26. Futamata, M. Appl. Opt. 1997, 36, 364
27. Giergiel, J.; Reed, C. E.; Hemminger, J. C.; Ushioda, S. J. Phys. Chem. 1988, 92, 5357
28. Kurosawa, K.; Pierce, R. M.; Ushioda, S.; Hemminger, J. C. Phys. Rev. B: Condens. Matter Mater. Phys. 1986, 33, 789
29. Liu, Y.; Xu, S.-P.; Xuyang, X.; Zhao, B.; Xu, W.-Q. J. Phys. Chem. Lett. 2011, 2, 2218
30. Meyer, S. A.; Le Ru, E. C.; Etchegoin, P. G. Anal. Chem. (Washington, DC, United States) 2011, 83, 2337
31. Zerulla, D.; Isfort, G.; Kolbach, M.; Otto, A.; Schierbaum, K. Electrochim. Acta 2003, 48, 2943
32. Hansen, W. N. J. Opt. Soc. Am. 1968, 58, 380
33. Kretschmann, E.; Raether, H. Z. Naturfors., A 1968, 23, 2135
34. Raether, H. Surface Plasmons on Smooth and Rough Surfaces and on Gratings; Springer-Verlag: Berlin, 1988; Vol. 111.
35. Code for Fresnel calculations was generously made available by Prof. Robert Corn at http://corninfo.ps.uci.edu/calculations.html.
36. Pettinger, B.; Tadjeddine, A.; Kolb, D. M. Chem. Phys. Lett. 1979, 66, 544