Plasmon waveguide resonance Raman spectroscopy

Analytical Chemistry

Volumn 84, Issue 21, 2012, Pages 9049-9055

  McKee, Kristopher J ^a,b   Meyer, Matthew W ^a,b   Smith, Emily A ^a,b  

^a U S DEPARTMENT OF ENERGY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACQUISITION TIME; ANALYTES; AU FILM; CHEMICAL SPECIFICITY; EXCITATION WAVELENGTH; INCIDENT ANGLES; INCIDENT FIELDS; INCIDENT LIGHT; MEAN SQUARE; NON-RESONANT EXCITATION; ORTHOGONAL POLARIZATIONS; P-POLARIZED; PLASMON WAVEGUIDE; PLASMON WAVEGUIDE RESONANCES; POLARIZATION CONTROL; POLYSTYRENE FILMS; RAMAN PEAK; RAMAN SCATTER; RAMAN SIGNAL; REFLECTED LIGHT; SIGNAL ENHANCEMENT; SILANE MONOLAYERS; SURFACE SENSITIVITY; TOTAL INTERNAL REFLECTIONS; TRIMETHYL;

ELECTRIC FIELDS; GOLD; MONOLAYERS; PLASMONS; POLARIZATION; POLYSTYRENES; PRISMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SAPPHIRE; SURFACE PLASMON RESONANCE; WAVEGUIDES;

INTERFACES (MATERIALS);

EID: 84868575008     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac3013972     Document Type: Article

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