Localized optical phenomena and the characterization of materials interfaces

Annual Review of Materials Science

Volumn 27, Issue 1, 1997, Pages 469-498

  Bohn, Paul W ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Electronic materials; Infrared spectroscopy; Interfaces; Near field scanning; Optical microscopy; Raman scattering; Surface plasmons; Waveguides

Indexed keywords

INFRARED SPECTROSCOPY; OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; RAMAN SCATTERING; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY SPECTROSCOPY;

ELECTRONIC MATERIALS; SURFACE PLASMONS;

INTERFACES (MATERIALS);

EID: 0030692150     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.27.1.469     Document Type: Article

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