Nanoscale characterization of emergent phenomena in multiferroics

Current Opinion in Solid State and Materials Science

Volumn 16, Issue 5, 2012, Pages 216-226

  He, Q ^a   Arenholz, E ^a   Scholl, A ^a   Chu, Y H ^b,c   Ramesh, R ^b,d  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d University of California Berkeley   (United States)

Author keywords

Magnetoelectrics; Multiferroics; Photoemission electron microscope

Indexed keywords

ELECTRON MICROSCOPES; PHOTOEMISSION;

CHARACTERIZATION TOOLS; EMERGENT PHENOMENON; MAGNETOELECTRICS; MULTIFERROICS; NANOSCALE CHARACTERIZATION; NANOSCALE SPATIAL RESOLUTION; PHOTOEMISSION ELECTRON MICROSCOPE; PHOTOEMISSION ELECTRON MICROSCOPY;

NANOTECHNOLOGY;

EID: 84868537890     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cossms.2012.03.006     Document Type: Review

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