Images of the antiferromagnetic structure of a NiO(100) surface by means of X-ray magnetic linear dichroism spectromicroscopy

Physical Review Letters

Volumn 83, Issue 9, 1999, Pages 1862-1865

  Stohr J ^a   Scholl, A ^b   Regan, T J ^c   Anders, S ^b   Luning J ^a   Scheinfein, M R ^d   Padmore, H A ^b   White, R L ^e  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d ARIZONA STATE UNIVERSITY   (United States)

^e Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; FILM GROWTH; INTERFACES (MATERIALS); MAGNESIA; MAGNETIC DOMAINS; MICROSCOPIC EXAMINATION; NICKEL COMPOUNDS; POLYCRYSTALLINE MATERIALS; X RAY SPECTROSCOPY;

NEEL TEMPERATURE; NICKEL OXIDE; PHOTOELECTRON EMISSION MICROSCOPY (PEEM); X RAY MAGNETIC LINEAR DICHROISM (XMLD) SPECTROSCOPY;

MAGNETIC THIN FILMS;

EID: 0037849083     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.1862     Document Type: Article

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