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Volumn 82, Issue 14, 2010, Pages

Probing ferroelectricity in PbZr0.2 Ti0.8 O 3 with polarized soft x rays

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EID: 78049466886     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.140103     Document Type: Article
Times cited : (47)

References (16)
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    • 1/2 3d (e) regions, respectively, to account for intrinsic lifetime broadening and with a Gaussian of σ=0.14 eV for instrumental broadening.
    • 1 / 2 3 d (e) regions, respectively, to account for intrinsic lifetime broadening and with a Gaussian of σ = 0.14 eV for instrumental broadening.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.