Strain-driven phase boundaries in BiFeO 3 thin films studied by atomic force microscopy and x-ray diffraction

Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 1, 2012, Pages

  Liu, Heng Jui ^b,c   Liang, Chen Wei ^a   Liang, Wen I ^a   Chen, Hsiang Jung ^a   Yang, Jan Chi ^a   Peng, Chun Yen ^a   Wang, Guang Fu ^d   Chu, Feng Nan ^d   Chen, Yi Chun ^d   Lee, Hsin Yi ^c   Chang, Li ^a   Lin, Su Jien ^b   Chu, Ying Hao ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84860769123     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.014104     Document Type: Article

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