Ti-doped ZnO thin films prepared at different ambient conditions: Electronic structures and magnetic properties

Materials

Volumn 3, Issue 6, 2010, Pages 3642-3653

  Yong, Zhihua ^a   Liu, Tao ^a,b   Uruga, Tomoya ^c   Tanida, Hajime ^c   Qi, Dongchen ^a   Rusydi, Andrivo ^a   Wee, Andrew T S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

DMS; Ti; Vacancy; XAFS; ZnO

Indexed keywords

AMBIENT ATMOSPHERE; AMBIENT CONDITIONS; DMS; SATURATION MAGNETIC MOMENTS; TETRAHEDRAL COORDINATION; X RAY ABSORPTION FINE STRUCTURES; XAFS; ZNO;

ELECTRONIC STRUCTURE; METALLIC FILMS; OPTICAL FILMS; TITANIUM; VACANCIES; X RAY SPECTROSCOPY; ZINC OXIDE;

FILM PREPARATION;

EID: 84868339148     PISSN: None     EISSN: 19961944     Source Type: Journal    
DOI: 10.3390/ma3063642     Document Type: Article

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