Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system

Nanotechnology

Volumn 23, Issue 47, 2012, Pages

  Pilet, Nicolas ^a   Raabe, Joerg ^a   Stevenson, Stephanie E ^a   Romer, Sara ^b   Bernard, Laetitia ^b   McNeill, Christopher R ^c   Fink, Rainer H ^d   Hug, Hans J ^b   Quitmann, Christoph ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c MONASH UNIVERSITY   (Australia)

^d UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; BEAM LINES; CHEMICAL COMPOSITIONS; COMPLEMENTARY ACCESS; EXPERIMENTAL TECHNIQUES; FORCE MICROSCOPY; LATERAL SCALE; LOCAL MECHANICAL PROPERTIES; NANOMETER-SCALE RESOLUTION; NANOSCALE PROPERTIES; SCANNING FORCE MICROSCOPES; SCANNING TRANSMISSION X RAY MICROSCOPY; SWISS LIGHT SOURCES; X-RAY TRANSMISSION;

ELECTRONIC STRUCTURE; MAGNETIC PROPERTIES; MECHANICAL PROPERTIES; SCANNING TUNNELING MICROSCOPY; X RAYS;

ELECTRIC PROPERTIES;

EID: 84868329262     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/47/475708     Document Type: Article

References (26)

1. Stöhr J 1992 NEXAFS Spectroscopy (Springer Series in Surface Sciences) vol 25 (Berlin: Springer)
2. Ade H and Stoll H 2009 Near-edge x-ray absorption fine-structure microscopy of organic and magnetic materials Nature Mater. 8 281-90
3. Kaulich B, Thibault P, Gianoncelli A and Kiskinova M 2011 Transmission and emission x-ray microscopy: operation modes, contrast mechanisms and applications J. Phys.: Condens. Matter 23 083002
4. García R and Pérez R 2002 Dynamic atomic force microscopy methods Surf. Sci. Rep. 47 197-301 (Pubitemid 35022824)
5. Meyer E, Hug H J and Bennewitz R 2004 Scanning Probe Microscopy (Berlin: Springer)
6. Sugimoto Y, Pou P, Abe M, Jelinek P, Perez R, Morita S and Custance O 2007 Chemical identification of individual surface atoms by atomic force microscopy Nature 446 64-7 (Pubitemid 46348038)
7. Chiu C Y, Chan Y L, Hsu Y J and Wei D H 2008 Collecting photoelectrons with a scanning tunneling microscope nanotip Appl. Phys. Lett. 92 103101 (Pubitemid 351393965)
8. Fauquet C et al 2011 Combining scanning probe microscopy and x-ray spectroscopy Nanoscale Res. Lett. 6 308
9. Okuda T, Eguchi T, Akiyama K, Harasawa A, Kinoshita T, Hasegawa Y, Kawamori M, Haruyama Y and Matsui S 2009 Nanoscale chemical imaging by scanning tunneling microscopy assisted by synchrotron radiation Phys. Rev. Lett. 102 105503
10. Saito A et al 2008 Nanoscale elemental identification by synchrotron-radiation-based scanning tunneling microscopy Surf. Interface Anal. 40 1033-6
11. Rodrigues M S, Dhez O, Le Denmat S, Chevrier J, Felici R and Comin F 2008 Local detection of x-ray spectroscopies with an in situ atomic force microscope J. Instrum. 3 P12004
12. Cummings M L, Chien T Y, Preissner C, Madhavan V, Diesing D, Bode M, Freeland J W and Rose V 2012 Combining scanning tunneling microscopy and synchrotron radiation for high-resolution imaging and spectroscopy with chemical, electronic, and magnetic contrast Ultramicroscopy 112 22-31
13. Schmid I, Raabe J, Sarafimov B, Quitmann C, Vranjkovic S, Pellmont Y and Hug H J 2010 Coaxial arrangement of a scanning probe and an x-ray microscope as a novel tool for nanoscience Ultramicroscopy 110 1267-72
14. Flechsig U, Quitmann C, Raabe J, Boge M, Fink R and Ade H 2007 The PolLux microspectroscopy beam line at the Swiss Light Source Synchrotron Radiat. Instrum. 879 505-8 Pts. 1 and 2
15. Raabe J et al 2008 PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light Source Rev. Sci. Instrum. 79 113704
16. Schmid I, Raabe J, Quitmann C, Vranjkovic S, Hug H J and Fink R H 2009 NanoXAS, a novel concept for high resolution microscopy J. Phys. Conf. Ser. 186 012015
17. McNeill C R and Greenham N C 2009 Conjugated-polymer blends for optoelectronics Adv. Mater. 21 3840-50
18. Bosshard C and Lee K-S 2002 Polymers for Photonics Applications vol 1 (Berlin: Springer)
19. Goffri S, Müeller C, Stingelin-Stutzmann N, Breiby D W, Radano C P, Andreasen J W, Thompson R, Janssen R A J, Nielsen M M, Smith P and Sirringhaus H 2006 Multicomponent semiconducting polymer systems with low crystallization-induced percolation threshold Nature Mater. 5 950-6 (Pubitemid 44847490)
20. Schuettfort T, Watts B, Thomsen L, Lee M, Sirringhaus H and McNeill C R 2012 Microstructure of polycrystalline pbttt films: domain mapping and structure formation ACS Nano 6 1849-64
21. Wang J, Morin C, Li L, Hitchcock A P, Scholl A and Doran A 2009 Radiation damage in soft x-ray microscopy J. Electron Spectrosc. Relat. Phenom. 170 25-36
22. Morin C et al 2001 X-ray spectromicroscopy of immiscible polymer blends: polystyrene-poly(methyl methacrylate) J. Electron Spectrosc. Relat. Phenom. 121 203-24 (Pubitemid 33039216)
23. Watts B, Swaraj S, Nordlund D, Luning J and Ade H 2011 Calibrated nexafs spectra of common conjugated polymers rid a-8902-2008 rid e-7471-2011 J. Chem. Phys. 134 024702
24. Schmid I, Marioni M A, Kappenberger P, Romer S, Parlinska-Wojtan M, Hug H J, Hellwig O, Carey M J and Fullerton E E 2010 Exchange bias and domain evolution at 10 nm scales Phys. Rev. Lett. 105 197201
25. Joshi N R, Ozer S, Ashworth T V, Stickar P G, Romer S, Marioni M A and Hug H J 2011 Engineering the ferromagnetic domain size for optimized imaging of the pinned uncompensated spins in exchange-biased samples by magnetic force microscopy Appl. Phys. Lett. 98 082502
26. Scheurer F, Beaurepaire E, Bulou H and J-P Kappler (ed) 2010 Magnetism and Synchrotron Radiation New Trends (Springer Proceedings in Physics vol 133) (Berlin: Springer) chapter (Magnetic Imaging with X-rays)