The polLux microspectroscopy beam line at the swiss light source

AIP Conference Proceedings

Volumn 879, Issue , 2007, Pages 505-508

  Flechsig, U ^a   Quitmann, C ^a   Raabe, J ^a   Boge M ^a   Fink, R ^b   Ade, H ^c  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Beamline optics; Grating efficiency; Microscopy; X rays; Zone plates

Indexed keywords

EID: 33947428301     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436109     Document Type: Conference Paper

References (14)

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