Local detection of X-ray spectroscopies with an in-situ atomic force microscope

Journal of Instrumentation

Volumn 3, Issue 12, 2008, Pages

  Rodrigues, M S ^a   Dhez, O ^a   Denmat, S Le ^a   Chevrier, J ^b   Felici, R ^a   Comin, F ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Beam intensity monitors; Beam line instrumentation (beam position and profile monitors; Bunch length monitors); Interaction of radiation with matter; Photoemission; X ray diffraction detectors

Indexed keywords

ABSORPTION CO-EFFICIENT; ATOMIC FORCE IMAGING; BUNCH LENGTH; DIFFRACTION MEASUREMENTS; INTERACTION OF RADIATION WITH MATTER; PROFILE MONITOR; SYNCHROTRON RADIATION TECHNIQUES; X-RAY MICROBEAMS;

LIGHT; PHOTOEMISSION; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 62749180236     PISSN: 17480221     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/3/12/P12004     Document Type: Article

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