Line scan - Structured illumination microscopy super-resolution imaging in thick fluorescent samples

Optics Express

Volumn 20, Issue 22, 2012, Pages 24167-24174

  Mandula, Ondrej ^a   Kielhorn, Martin ^c,d   Wicker, Kai ^b,c   Krampert, Gerhard ^e   Kleppe, Ingo ^e   Heintzmann, Rainer ^b,c,d  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^d KING'S COLLEGE LONDON   (United Kingdom)

^e CARL ZEISS SMT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ILLUMINATION PATTERNS; INNER STRUCTURE; LINE SCAN; LINESCANNING; OUT-OF-FOCUS; RECONSTRUCTED IMAGE; STRUCTURED ILLUMINATION MICROSCOPY; SUPER RESOLUTION; SUPER RESOLUTION IMAGING;

OPTICAL RESOLVING POWER;

FLUORESCENCE;

EID: 84868241382     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.024167     Document Type: Article

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