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Volumn 34, Issue 6-7, 2003, Pages 283-291

Saturated patterned excitation microscopy with two-dimensional excitation patterns

Author keywords

Non linear microscopy; Resolution enhancement; Structured illumination; Virtual microscopy; Widefield

Indexed keywords


EID: 0141792843     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(03)00053-2     Document Type: Conference Paper
Times cited : (124)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.