Laterally modulated excitation microscopy: Improvement of resolution by using a diffraction grating

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3568, Issue , 1999, Pages 185-196

  Heintzmann, R ^a   Cremer, C ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIFFRACTION GRATINGS; IMAGE QUALITY; LIGHT MODULATION; OPTICAL INSTRUMENT LENSES;

LATERAL MODULATION EXCITATION MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032639282     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)