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Volumn 33, Issue 16, 2008, Pages 1813-1815
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Improved sectioning in a slit scanning confocal microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCOPES;
ARRAY DETECTORS;
AXIAL RESOLUTIONS;
BACKGROUND SUBTRACTION;
LINE DETECTORS;
OUT-OF FOCUS IMAGE;
OUT-OF-FOCUS LIGHT;
SCANNING CONFOCAL MICROSCOPES;
SLIT SCANNING;
SCANNING;
FLUORESCENT DYE;
ALGORITHM;
ARTICLE;
CHEMISTRY;
CONFOCAL MICROSCOPY;
EQUIPMENT DESIGN;
FLUORESCENCE;
IMAGE PROCESSING;
IMAGE SUBTRACTION;
INSTRUMENTATION;
METHODOLOGY;
POLLEN;
REPRODUCIBILITY;
STATISTICAL MODEL;
ALGORITHMS;
EQUIPMENT DESIGN;
FLUORESCENCE;
FLUORESCENT DYES;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, CONFOCAL;
MODELS, STATISTICAL;
POLLEN;
REPRODUCIBILITY OF RESULTS;
SUBTRACTION TECHNIQUE;
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EID: 50549086262
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.33.001813 Document Type: Article |
Times cited : (25)
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References (9)
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