Effects of chirality and impurities on the performance of carbon nanotube-based piezoresistive sensors

Carbon

Volumn 51, Issue 1, 2013, Pages 59-63

  Cullinan, Michael A ^a,b   Culpepper, Martin L ^a  

^a Massachusetts Institute of Technology   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL BREAKDOWN; FABRICATION PROCESS; GAUGE FACTORS; HIGH PURITY; IMPURITIES IN; LOW RESISTANCE; PIEZORESISTIVE SENSORS; SENSOR SYSTEMS; STRAIN SENSITIVITY; ULTRACENTRIFUGATION;

AUTOMOBILE MANUFACTURE; CARBON NANOTUBES; CENTRIFUGATION; CHIRALITY; ELECTRIC BREAKDOWN OF LIQUIDS; ENANTIOMERS; GAGES;

SENSORS;

EID: 84868142218     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.08.011     Document Type: Article

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