Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells

Progress in Photovoltaics: Research and Applications

Volumn 20, Issue 7, 2012, Pages 892-898

  Major, Jonathan D ^a,b   Bowen, Leon ^a   Durose, Ken ^a,b  

^a DURHAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

CdTe; focussed ion beam; interface phenomena; thin film

Indexed keywords

ACID ETCHING; AS-GROWN; CDS LAYER; CDTE; CDTE SOLAR CELLS; CELL STRUCTURE; CROSS SECTION; DEVICE PERFORMANCE; FOCUSSED ION BEAM MILLINGS; FOCUSSED ION BEAM TECHNIQUE; FOCUSSED ION BEAMS; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; INTERFACE PHENOMENA; PROCESSING STAGE; THIN FILM LAYERS; THIN FILM PHOTOVOLTAICS; THIN-FILM SOLAR CELLS;

CADMIUM CHLORIDE; CADMIUM COMPOUNDS; CADMIUM SULFIDE; GRAIN BOUNDARIES; ION BEAMS; NITRIC ACID; PHOSPHORIC ACID; PHOTOVOLTAIC CELLS; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; THIN FILMS;

CADMIUM TELLURIDE;

EID: 84867876867     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1164     Document Type: Article

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