Microtexture of chloride treated CdTe thin films deposited by CSS technique

Journal of Materials Science

Volumn 43, Issue 2, 2008, Pages 573-579

  Quadros, João ^a   Pinto, André L ^a   Moutinho, Hélio R ^b   Dhere, Ramesh G ^b   Cruz, Leila R ^a  

^a MILITARY INSTITUTE OF ENGINEERING   (Brazil)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; CHLORIDE MINERALS; GRAIN BOUNDARIES; HIGH TEMPERATURE EFFECTS; SCANNING ELECTRON MICROSCOPY;

COINCIDENT SITE LATTICE BOUNDARY MAPS; ELECTRON BACK-SCATTERED DIFFRACTION PATTERNS; MISORIENTATION;

THIN FILMS;

EID: 37249026805     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-007-1708-5     Document Type: Conference Paper

References (12)

1. Wu X, Keane JC, Dhere RG, Dehart C, Albin DS, Duda A, Gessert TA, Asher S, Levi DH, Sheldon P (2001) In: Proceedings of the 17th European photovoltaic solar energy conference, Munich, Germany, October 2001. WIP (ed), Munich, p 995
2. Moutinho HR, Dhere RG, Al-Jassim MM, Levi DH, Kazmerski LL (1999) J Vac Sci Technol A 17(4):1793
3. Ferekides CS, Marinskiy D, Viswanathan V, Tetali B, Palekis V, Selvaraj P, Morel DL (2000) Thin Solid Films 361-362:520
4. Al-Jassim MM, Yan Y, Moutinho HR, Romero MJ, Dhere RG, Jones KM (2001) Thin Solid Films 387:246
5. Moutinho HR, Dhere RG, Ballif C, Al-Jassim MM, Kazmerski LL (2000) J Vac Sci Technol A 18(4):1599
6. Moutinho HR, Dhere RG, Al-Jassim MM, Ballif C, Levi DH, Swartzlander AB, Young MR, Kazmerski LL (2000) In: Proceedings of the 28th IEEE photovoltaic specialists conference, Anchorage, Alaska, September 2000. IEEE (ed), p 646
7. Randle V (1992) Microtexture determination and its applications. The Institute of Materials, London, p 18
8. Cruz LR, Pinto AL, Souza MS, Moutinho HR, Dhere RG (2005) In: Proceedings of the 31st IEEE photovoltaic specialists conference, Florida, USA, January 2005. IEEE (ed), p 453
9. Humphreys FJ (1999) In: Szpunar JA (ed) Proceedings of the 12th International Conference on Texture of Materials, Montreal, Canada, August 1999. NRC Research Press, p 74
10. Humphreys FJ, Hatherly M (1995) Recrystallization and related annealing phenomena. Elsevier Science Ltd., UK
11. Matson RJ, Hasoon FS, Jones KM, Al-Jassim MM, Tomlinson RD (1994) Progr Photovolt Res Appl 2:203
12. Bonnet D (2000) Thin Solid Films 361-362:547