Maximum-entropy-method charge densities based on structure-factor extraction with the commonly used Rietveld refinement programs GSAS, FullProf and Jana2006

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 68, Issue 6, 2012, Pages 750-762

  Bindzus, Niels ^a   Iversen, Bo Brummerstedt ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

charge density; maximum entropy method; Rietveld refinement; synchrotron powder X ray diffraction

Indexed keywords

EID: 84867820746     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767312037269     Document Type: Article

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