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Volumn 66, Issue 2, 2010, Pages 184-195
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Maximum entropy method and charge flipping, a powerful combination to visualize the true nature of structural disorder from in situ X-ray powder diffraction data
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Author keywords
Charge flipping; Disorder; Maximum entropy method; X ray powder diffraction
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Indexed keywords
AB INITIO;
AMBIENT TEMPERATURES;
CARBONATE ANION;
CHARGE FLIPPING;
DISORDERED CRYSTALS;
DISORDERED MATERIALS;
ELECTRON DENSITIES;
ELECTRON DENSITY DISTRIBUTION;
EXPERIMENTAL DATA;
FAST METHODS;
HISTOGRAM MATCHING;
IN-SITU;
MAXIMUM ENTROPY METHODS;
POWDER DIFFRACTION;
REFINED MODEL;
RIETVELD;
STRUCTURAL DISORDERS;
STRUCTURE FACTORS;
ELECTRONS;
ENTROPY;
GRAPHIC METHODS;
RIETVELD METHOD;
RIETVELD REFINEMENT;
X RAY POWDER DIFFRACTION;
CRYSTAL STRUCTURE;
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EID: 77949899040
PISSN: 01087681
EISSN: 01087681
Source Type: Journal
DOI: 10.1107/S0108768109052616 Document Type: Article |
Times cited : (8)
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References (25)
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