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Volumn 66, Issue 2, 2010, Pages 184-195

Maximum entropy method and charge flipping, a powerful combination to visualize the true nature of structural disorder from in situ X-ray powder diffraction data

Author keywords

Charge flipping; Disorder; Maximum entropy method; X ray powder diffraction

Indexed keywords

AB INITIO; AMBIENT TEMPERATURES; CARBONATE ANION; CHARGE FLIPPING; DISORDERED CRYSTALS; DISORDERED MATERIALS; ELECTRON DENSITIES; ELECTRON DENSITY DISTRIBUTION; EXPERIMENTAL DATA; FAST METHODS; HISTOGRAM MATCHING; IN-SITU; MAXIMUM ENTROPY METHODS; POWDER DIFFRACTION; REFINED MODEL; RIETVELD; STRUCTURAL DISORDERS; STRUCTURE FACTORS;

EID: 77949899040     PISSN: 01087681     EISSN: 01087681     Source Type: Journal    
DOI: 10.1107/S0108768109052616     Document Type: Article
Times cited : (8)

References (25)
  • 16
    • 37549070396 scopus 로고    scopus 로고
    • Takata, M. (2008). Acta Cryst. A64, 232-245.
    • (2008) Acta Cryst , vol.A64 , pp. 232-245
    • Takata, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.