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Volumn 356-357, Issue , 2003, Pages 84-86

Charge density measurement in MgH2 by synchrotron X-ray diffraction

Author keywords

Charge density; Hydrogen storage materials; Magnesium hydride; Synchrotron radiation; X ray diffraction

Indexed keywords

CHEMICAL BONDS; DEHYDROGENATION; POSITIVE IONS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

EID: 0042698656     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(03)00104-X     Document Type: Conference Paper
Times cited : (51)

References (14)
  • 7
    • 0042303354 scopus 로고    scopus 로고
    • http://www.spring8.or.jp/ENGLISH/facility/bl/PublicBeamline/BL02B2/index.html
    • http://www.spring8.or.jp/ENGLISH/general_info/overview/ http://www.spring8.or.jp/ENGLISH/facility/bl/PublicBeamline/BL02B2/index.html.
  • 8
    • 0004326059 scopus 로고
    • YoungR.A. Oxford: Oxford Univ. Press, Ch. 13
    • Izumi F. Young R.A. The Rietveld Method. 1993;Oxford Univ. Press, Oxford. Ch. 13.
    • (1993) The Rietveld Method
    • Izumi, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.