Charge density studies utilizing powder diffraction and MEM. Exploring of high Tc superconductors, C60 superconductors and manganites

Zeitschrift fur Kristallographie

Volumn 216, Issue 2, 2001, Pages 71-86

  Takata, M ^a   Nishibori, E ^a   Sakata, M ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FULLERENE; MANGANESE DERIVATIVE; METAL; OXYGEN;

CONDUCTOR; CRYSTAL STRUCTURE; DENSITY; ELECTRON; ENTROPY; REVIEW; X RAY POWDER DIFFRACTION;

EID: 0035138214     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.216.2.71.20335     Document Type: Review

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