Accurate structure factors and experimental charge densities from synchrotron X-ray powder diffraction data at SPring-8

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 63, Issue 1, 2007, Pages 43-52

  Nishibori, Eiji ^a   Sunaoshi, Eiji ^a   Yoshida, Akihiro ^a   Aoyagi, Shinobu ^a   Kato, Kenichi ^b,c,d   Takata, Masaki ^b,c,d   Sakata, Makoto ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d RIKEN SPring 8 Center ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIAMOND; SILICON;

ARTICLE; CHEMISTRY; COMPARATIVE STUDY; ENTROPY; METHODOLOGY; STATISTICAL ANALYSIS; X RAY DIFFRACTION;

DATA INTERPRETATION, STATISTICAL; DIAMOND; ENTROPY; SILICON; X-RAY DIFFRACTION;

EID: 33846052415     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767306047210     Document Type: Article

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