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Volumn 64, Issue 3, 2008, Pages 404-418

Foundations of residual-density analysis

Author keywords

Residual density analysis

Indexed keywords


EID: 42449129264     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767308006879     Document Type: Article
Times cited : (159)

References (19)
  • 5
    • 42449141392 scopus 로고    scopus 로고
    • In X-Ray Charge Densities and Chemical Bonding, IUCr Texts on Crystallography
    • Coppens, P. (1997). In X-Ray Charge Densities and Chemical Bonding, IUCr Texts on Crystallography, No. 4. Oxford University Press/IUCr.
    • (1997) Oxford University Press/IUCr , Issue.4
    • Coppens, P.1
  • 19
    • 42449145452 scopus 로고    scopus 로고
    • Volkov, A., Macchi, P., Farrugia, L. J., Gatti, C., Mallinson, P., Richter, T. & Koritsanszky, T. (2006). XD2006 - A Computer Program Package for Multipole Refinement, Topological Analysis of Charge Densities and Evaluation of Intermolecular Interaction Energies from Experimental and Theoretical Structure Factors. University at Buffalo, State University of New York, NY, USA; University of Milano, Italy; University of Glasgow, UK; CNRISTM, Milano, Italy; Middle Tennessee State University, TN, USA.
    • Volkov, A., Macchi, P., Farrugia, L. J., Gatti, C., Mallinson, P., Richter, T. & Koritsanszky, T. (2006). XD2006 - A Computer Program Package for Multipole Refinement, Topological Analysis of Charge Densities and Evaluation of Intermolecular Interaction Energies from Experimental and Theoretical Structure Factors. University at Buffalo, State University of New York, NY, USA; University of Milano, Italy; University of Glasgow, UK; CNRISTM, Milano, Italy; Middle Tennessee State University, TN, USA.


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