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Morozov, S.V.3
Jiang, D.4
Zhang, Y.5
Dubonos, S.V.6
Grigorieva, I.V.7
Firsov, A.A.8
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44
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34948892768
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Graphene thickness determination using reflection and contrast spectroscopy
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DOI 10.1021/nl071254m
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Ni, Z. H.; Wang, H. M.; Kasim, J.; Fan, H. M.; Yu, T.; Wu, Y. H.; Feng, Y. P.; Shen, Z. X. Graphene Thickness Determination Using Reflection and Contrast Spectroscopy Nano Lett. 2007, 7, 2758-2763 (Pubitemid 47522434)
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(2007)
Nano Letters
, vol.7
, Issue.9
, pp. 2758-2763
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Ni, Z.H.1
Wang, H.M.2
Kasim, J.3
Fan, H.M.4
Yu, T.5
Wu, Y.H.6
Feng, Y.P.7
Shen, Z.X.8
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