메뉴 건너뛰기




Volumn , Issue , 2012, Pages 8-13

Evaluation of 3D interconnect routing and stacking strategy to optimize high speed signal transmission for memory on logic

Author keywords

[No Author keywords available]

Indexed keywords

3D INTERCONNECT; 3D STACKING; 3D STACKING TECHNOLOGY; DATA RATES; FACE TO FACE; HIGH SPEED SIGNAL TRANSMISSION; HIGH-SPEED DATA TRANSMISSION; INTEGRATION DENSITY; LOGIC APPLICATIONS; ROADMAP;

EID: 84866864783     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2012.6248798     Document Type: Conference Paper
Times cited : (23)

References (15)
  • 1
    • 33947407658 scopus 로고    scopus 로고
    • Three-dimensional integrated circuits and future of system-on-chip designs
    • Patti, R.S. "Three-dimensional integrated circuits and future of system-on-chip designs", Proceedings of the IEEE, Vol. 94, Issue 6, (2006), pp. 1214-1224
    • (2006) Proceedings of the IEEE , vol.94 , Issue.6 , pp. 1214-1224
    • Patti, R.S.1
  • 7
    • 79955711352 scopus 로고    scopus 로고
    • A 1.2V 12.8 GB/s 2Gb mobile Wide-I/O DRAM with 4x128 I/Os using TSV-based stacking
    • J. Kim, et al., "A 1.2V 12.8 GB/s 2Gb mobile Wide-I/O DRAM with 4x128 I/Os using TSV-based stacking," Solid-State Circuits Conference, 20-24 Feb., San Francisco, 2011, pp. 496-498
    • Solid-State Circuits Conference, 20-24 Feb., San Francisco, 2011 , pp. 496-498
    • Kim, J.1
  • 8
    • 79953177459 scopus 로고    scopus 로고
    • 1-Tbyte/s 1-Gbit DRAM Architecture Using 3-D Interconnect for High-Throughput Computing
    • April
    • T. Sekiguchi, K. Ono, A. Kotabe, Y. Yanagawa, "1-Tbyte/s 1-Gbit DRAM Architecture Using 3-D Interconnect for High-Throughput Computing," Solid-State Circuits, IEEE Journal of, vol. 46, no. 4, April 2011, pp. 828-837
    • (2011) Solid-State Circuits, IEEE Journal of , vol.46 , Issue.4 , pp. 828-837
    • Sekiguchi, T.1    Ono, K.2    Kotabe, A.3    Yanagawa, Y.4
  • 10
    • 77955208053 scopus 로고    scopus 로고
    • TSV silicon interposer technology for 3D wafer level system integration - Technological milestones and challenges
    • K. Zoschke, J. Wolf, "TSV silicon interposer technology for 3D wafer level system integration - technological milestones and challenges-", Proc. 30th Tokyo OHKA Seminar, December 1st, 2009, Tokyo, Japan, pp. 31-53
    • Proc. 30th Tokyo OHKA Seminar, December 1st, 2009, Tokyo, Japan , pp. 31-53
    • Zoschke, K.1    Wolf, J.2
  • 14
    • 79960424391 scopus 로고    scopus 로고
    • Electrical Characterization and Impact on Signal Integrity of New Basic Interconnection Elements inside 3D Integrated Circuits
    • Roullard, J et al., "Electrical Characterization and Impact on Signal Integrity of New Basic Interconnection Elements inside 3D Integrated Circuits", Electronic Components and Technology Conference (ECTC), Lake Buena Vista, June. 2011, pp. 1176-1182
    • Electronic Components and Technology Conference (ECTC), Lake Buena Vista, June. 2011 , pp. 1176-1182
    • Roullard, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.