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Solid-State Electronics

Volumn 78, Issue , 2012, Pages 68-74

Characteristics of THz carrier dynamics in GaN thin film and ZnO nanowires by temperature dependent terahertz time domain spectroscopy measurement

(6) Balci, Soner a Baughman, William a Wilbert, David S a Shen, Gang a Kung, Patrick a Kim, Seongsin Margaret a

a The University of Alabama (United States)

Author keywords

Carrier dynamics; Complex conductivity; Drude Smith model; GaN; Terahertz time domain spectroscopy; ZnO

Indexed keywords

CARRIER DYNAMICS; COMPLEX CONDUCTIVITY; GAN; TERAHERTZ TIME DOMAIN SPECTROSCOPY; ZNO;

GALLIUM NITRIDE; NANOWIRES; PLASMA WAVES; REFRACTIVE INDEX;

ZINC OXIDE;

EID: 84866128511 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/j.sse.2012.05.050 Document Type: Conference Paper

Times cited : (28)

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