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Volumn 37, Issue 17, 2012, Pages 3708-3710

Extended depth of focus for transmission x-ray microscope

Author keywords

[No Author keywords available]

Indexed keywords

CURVELET TRANSFORMS; DATA SETS; DEPTH OF FOCUS; EXTENDED DEPTH OF FOCUS; IMAGE STACKS; NANOMETER RESOLUTIONS; STRUCTURAL INFORMATION; X RAY MICROSCOPY; X-RAY SOURCES;

EID: 84865704468     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.003708     Document Type: Article
Times cited : (16)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.