X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source

Zeitschrift fur Kristallographie

Volumn 222, Issue 11, 2007, Pages 650-655

  Tkachuk, Andrei ^a   Duewer, Fred ^a   Cui, Hongtao ^a   Feser, Michael ^a   Wang, Steve ^a   Yun, Wenbing ^a  

^a XRADIA INC   (United States)

Author keywords

Computed tomography; Fresnel zone plate; Fuel cell; Nanotechnology; SOFC; X ray microscopy

Indexed keywords

EID: 36949039216     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2007.222.11.650     Document Type: Article

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