Nanotechnology for forensic sciences: Analysis of PDMS replica of the case head of spent cartridges by optical microscopy, SEM and AFM for the ballistic identification of individual characteristic features of firearms

Forensic Science International

Volumn 222, Issue 1-3, 2012, Pages 288-297

  Valle, Francesco ^a   Bianchi, Michele ^a   Tortorella, Silvia ^a   Pierini, Giovanni ^b   Biscarini, Fabio ^a   D'Elia, Marcello ^c  

^a CNR   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c Gabinetto Regionale di Polizia Scientifica per l'Emilia Romagna   (Italy)

Author keywords

Atomic force microscopy; Ballistic; Cartidges; Nanotechnology; Replica molding

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; BALLISTICS; CRIME; FIREARM; FORENSIC SCIENCE; HUMAN; LEGAL EVIDENCE; MICROSCOPY; MORPHOLOGY; NANOFABRICATION; NANOTECHNOLOGY; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; STATISTICAL ANALYSIS;

EID: 84865617724     PISSN: 03790738     EISSN: 18726283     Source Type: Journal    
DOI: 10.1016/j.forsciint.2012.07.005     Document Type: Article

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