Measurement of DNA morphological parameters at highly entangled regime on surfaces

Journal of Physical Chemistry B

Volumn 113, Issue 15, 2009, Pages 4987-4990

  Caló, Annalisa ^a   Stoliar, Pablo ^a   Bystrenova, Eva ^a   Valle, Francesco ^a   Biscarini, Fabio ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; GENES; MICA; NUCLEIC ACIDS; POWER SPECTRUM; SILICATE MINERALS;

ATOMIC-FORCE MICROSCOPIES; CORRELATION LENGTH SCALE; DIFFUSION COEFFICIENTS; DIFFUSION-BASED MODELS; ENTANGLED NETWORKS; HIGH MOLECULAR WEIGHTS; INTERMOLECULAR DISTANCES; ISOLATED MOLECULES; MICA SURFACES; MORPHOLOGICAL PARAMETERS; PERSISTENCE LENGTHS; PLASMID DNAS; POWER SPECTRUM DENSITIES; SAMPLE MORPHOLOGIES; SUPERCOILED;

DNA;

EID: 65249089000     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp8097318     Document Type: Article

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