Probing buried organic layers in organic light-emitting diodes under operation by electric-field-induced doubly resonant sum-frequency generation spectroscopy

Applied Physics Letters

Volumn 101, Issue 7, 2012, Pages

  Miyamae, T ^a,b   Takada, N ^a,b   Tsutsui, T ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Chemical Materials Evaluation and Research Base (CEREBA)   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS VOLTAGE; ELECTRIC FIELD DISTRIBUTIONS; FORWARD VOLTAGE; LOCAL ELECTRIC FIELD; MULTILAYER ORGANIC LIGHT-EMITTING DIODE; ORGANIC LAYERS; REVERSE VOLTAGES; SIGNAL ENHANCEMENT; SUM-FREQUENCY GENERATION; SUM-FREQUENCY GENERATION SPECTROSCOPY;

ELECTRIC FIELDS; NAPHTHALENE;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 84865442393     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4746273     Document Type: Article

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