Focused ion beam induced structural modifications in thin magnetic films

Journal of Applied Physics

Volumn 112, Issue 3, 2012, Pages

  Roshchupkina, O D ^a   Grenzer, J ^a,b   Strache, T ^a,c   McCord, J ^a   Fritzsche, M ^a   Muecklich, A ^a   Baehtz, C ^a   Fassbender, J ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b Vacuumschmelze GmbH   (Germany)

^c UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE GROWTH; EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS; FLUENCES; FOCUSED ION BEAM TECHNIQUE; ION FLUENCES; NANOCRYSTALLINES; NONMAGNETICS; PERMALLOY FILMS; SATURATION POLARIZATION; STRUCTURAL CHANGE; STRUCTURAL INVESTIGATION; STRUCTURAL MODIFICATIONS; THIN MAGNETIC FILMS; TRANSMISSION ELECTRON MICROSCOPE; UNIT CELLS;

CRYSTALLITES; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; IRRADIATION; MAGNETIC DEVICES; MAGNETIC THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

FOCUSED ION BEAMS;

EID: 84865206642     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4739302     Document Type: Article

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