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Volumn 3, Issue 4, 2011, Pages 027-031
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Modeling of threshold voltage and drain current of uniaxial strained p-mosfets
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Author keywords
Mobility Strained si; Model; Numerical
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Indexed keywords
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EID: 84865135879
PISSN: 20776772
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (7)
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