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Volumn 3, Issue 1 PART4, 2011, Pages 755-765

Magnetron sputtered Al-ZnO thin films for photovoltaic applications

Author keywords

Al ZnO thin film; Electrical; Morphological characterization; Optical; Rf magnetron sputtering; Structural

Indexed keywords


EID: 84865120714     PISSN: 20776772     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (11)

References (13)
  • 5
    • 84865119937 scopus 로고    scopus 로고
    • Powder Diffraction File Committee on Powder Diffraction Standards Joint, ASTM (1998) (Card no. 36-1451)
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM (1998) (Card no. 36-1451).
  • 7
    • 0003443049 scopus 로고
    • Optical Processes in Semiconductors
    • Dover, New York
    • J.I. Pankove, Optical Processes in Semiconductors (Dover, New York, 1971).
    • (1971)
    • Pankove, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.