Effect of specimen misalignment on local structure analysis using annular dark-field imaging

Journal of Electron Microscopy

Volumn 61, Issue 4, 2012, Pages 207-215

  So, Yeong Gi ^a   Kimoto, Koji ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

annular dark field imaging; crystal tilt; local crystal structure analysis; scanning transmission electron microscopy

Indexed keywords

ALIGNMENT; ATOMS; CRYSTAL ORIENTATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DARK-FIELD IMAGING; ATOMIC COLUMNS; ATOMIC POSITIONS; BRIGHT SPOTS; CONVERGENCE ANGLE; CRYSTAL STRUCTURE ANALYSIS; CRYSTAL TILT; LOCAL CRYSTAL STRUCTURE ANALYSE; LOCAL STRUCTURE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

EID: 84864982260     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs045     Document Type: Article

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