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Volumn 14, Issue 8, 2012, Pages

Fabrication and characterization of compact silicon oxynitride waveguides on silicon chips

Author keywords

optical delay lines; silicon oxynitride; spiral waveguide

Indexed keywords

FABRICATION; NITRIDES; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON NITRIDE;

EID: 84864950860     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/14/8/085501     Document Type: Article
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.